Measurement and Analysis of Scattering Ratio of X-ray for TC4 Ti alloy and GH4169 Superalloy
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Abstract
Control X-ray scattering is one of the main means to improve image quality of radiographic. The scattering ratios of TC4 Ti alloy used by laser rapid prototyping technique and GH4169 superalloy materials irradiated by X-ray were measured through Mueller method. The results shown that, within the range of Xray energy in this paper, as the thickness of material was fixed, the Xray scattering ratio of the TC4 Ti alloy and GH4169 superalloy decreased when the increase of tube voltage in a range from 80 kV to 180 kV and 85 kV to 170 kV,respectively. The scattering ratio of two alloy materials kept constant when the tube exceeded 180 kV and 170 kV, respectively. Moreover, as the thickness ranged from 7mm to 40 mm and 1 to 14 mm, their scattering ratio are both had increasing trend. Therefore, whenever possible, appropriate increase of tube voltage is benefit to decrease the effect of scattered radiation in image quality.
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