单光束直入射云纹干涉计量——云纹相机和云纹显微镜
Moiré interferometry with single normal incident beam——Moiré camera & moiré microscope
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摘要: 本文用傅氏光学原理分析了光栅在斜入射与直入射之间的关系,提出了直入射云纹光路及其干涉原理.此光路除了继承斜入射波前干涉原理和有相同灵敏度外,还具有结构简化、紧凑,集光源到CCD成像为一体的特点,从而设计了云纹相机(f=300~2400线/毫米)和云纹显微镜(f=12000线/毫米或灵敏度=3.3纳米/线),实现了云纹测量仪器化.至此云纹实验勿需再采用分离元件在实验室的全息平台上进行,而可用于现场.Abstract: The background of the moiré interferometry with single normal incident beam is based upon the Fouries optical analysis of the relation between inclined and normal incident beam on a zero thickness grating. The new optical-path system not only carries forward the traditional advantages as well as the same sensitivity and the same wave-front interference but also the simplifying and compacting optical-path can collect total necessary components together from laser source to CCD imager system in an apparatus. Since the moiré tests don't need to work on the holographic platform in dark room with a lot of separated components. The designed moiré camera (f=300~2400 lines/mm) and moiré microscope (f=12000 lines/mm or sensitivity=83.3 nm/lines) accomplish the instrumentalize of moiré tests. As stated in the final section, the grating just like a fine scale for measurement of deformation. However, the scale can't measure an object with same order of magnitude because the deformed information of all the higher frequencies would be transformed into decaying waves arrested by the grating. According to the recent data concerned, the nanon grating and UV moiré will be a powerful tool for the research of micro fracture mechanics in the new century.