史有强, 吴昕昱, 张昳, 何山, 贾汶锦, 刘伟峰. 电磁屏蔽材料及其测试技术研究[J]. 失效分析与预防, 2021, 16(6): 426-434. DOI: 10.3969/j.issn.1673-6214.2021.06.012
    引用本文: 史有强, 吴昕昱, 张昳, 何山, 贾汶锦, 刘伟峰. 电磁屏蔽材料及其测试技术研究[J]. 失效分析与预防, 2021, 16(6): 426-434. DOI: 10.3969/j.issn.1673-6214.2021.06.012
    SHI You-qiang, WU Xin-yu, ZHANG Yi, HE Shan, JIA Wen-jin, LIU Wei-feng. Research of Electromagnetic Interference Shielding Materials and Test Techniques[J]. Failure Analysis and Prevention, 2021, 16(6): 426-434. DOI: 10.3969/j.issn.1673-6214.2021.06.012
    Citation: SHI You-qiang, WU Xin-yu, ZHANG Yi, HE Shan, JIA Wen-jin, LIU Wei-feng. Research of Electromagnetic Interference Shielding Materials and Test Techniques[J]. Failure Analysis and Prevention, 2021, 16(6): 426-434. DOI: 10.3969/j.issn.1673-6214.2021.06.012

    电磁屏蔽材料及其测试技术研究

    Research of Electromagnetic Interference Shielding Materials and Test Techniques

    • 摘要: 随着电磁污染及电磁波泄漏的日益严重,以电磁干扰(EMI)屏蔽材料为代表的电磁防护材料已经广泛应用在军用、民用电子设备中。目前,利用本征电磁性能制备的金属型EMI屏蔽材料,将高导电层与绝缘基体相结合的涂覆型EMI屏蔽材料,以及具有优良柔性的EMI屏蔽织物已经能够大批量生产。具有柔性、透明、可变形的新型EMI屏蔽材料日益增多,满足市场对材料多功能性、极端环境适用性、加工装配便捷性的新需求。EMI屏蔽测试技术在现有近场、远场测试技术基础上也呈现多元化、精细化的发展趋势。

       

      Abstract: With the severe electromagnetic pollution and microwave leakage, electromagnetic interference (EMI) shielding materials as a representative role of electromagnetic protection materials have been widely used in military and civilian electronic equipment. At present, metallic EMI shielding materials benefiting from their intrinsic electromagnetic properties, coated EMI shielding materials combining a highly conductive layer with an insulating substrate and EMI shielding fabrics with excellent flexibility have been able to be mass-produced. More and more new EMI shielding materials that are flexible, transparent, and deformable are invented to meet the new requirements of the shielding market for versatility, environmental applicability, and ease of processing and assembly. EMI shielding test technology also presents a diversified and refined development trend based on existing near-field and far-field test technologies.

       

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