Abstract: Shanghai synchrotron radiation facility (SSRF) is the third generation of synchrotron radiation facility. X-ray imaging at SSRF has the characteristics of high spatial resolution, fast temporal resolution and high contrast resolution and can realize in-situ, non-destructive, high-resolution, three-dimensional and dynamic imaging of material samples. Using the high coherence of synchrotron radiation light source, X-ray phase-contrast imaging can be realized with high contrast for low-Z materials such as polymers. Traditional X-ray absorption-contrast imaging can obtain low contrast for light element materials. In order to better support users, based on X ray imaging beamline at SSRF, quantitative phase-contrast imaging, dynamic CT imaging, CT imaging based on multiple contrast mechanisms, fast CT reconstruction and other imaging methods have been established and developed. This paper introduces the development of X-ray imaging methodology and its application in material science of X-ray imaging beamline at SSRF.